Presented at the Annual Meeting, AMERICAN CERAMIC SOCIETY, Cincinnati, Ohio, February 14, 1934 (Glass Division).
X-RAY DETERMINATION OF THE STRUCTURE OF GLASS*
Article first published online: 3 OCT 2006
Journal of the American Ceramic Society
Volume 17, Issue 1-12, pages 249–254, December 1934
How to Cite
WARREN, B. E. (1934), X-RAY DETERMINATION OF THE STRUCTURE OF GLASS. Journal of the American Ceramic Society, 17: 249–254. doi: 10.1111/j.1151-2916.1934.tb19316.x
- Issue published online: 3 OCT 2006
- Article first published online: 3 OCT 2006
- Received March 8, 1934
A method has been developed for analyzing the X-ray diffraction patterns of amorphous solids, and the atomic arrangement in two simple glasses has been completely worked out. In SO2, for example, each silicon is tetra-hedrally surrounded by 4 oxygens at a distance 1.60 AIR, and each oxygen is shared between two such tetrahedral groups. The mutual orientation of the two groups about their common direction of bonding is random, and hence it is a random three-dimensional network which is built up. The configuration does not repeat at regular intervals and hence is noncrystalline; it is this feature which distinguishes the glassy state from the crystalline.