Redistribution of Aluminum Ions During Processing of Sialon Ceramics

Authors

  • D. A. BONNELL,

    1. Department of Materials and Metallurgical Engineering, The University of Michigan, Ann Arbor, Michigan 48109, and Max-Planck-Institut für Metallforschung, Institut für Werktoffwissenschaften, 7000 Stuttgart 1, Federal Republic of Germany
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    • *

      Member, the American Ceramic Society.

    • The University of Michigan.

    • Max-Planck-Institut für Metallforschung.

  • M. RÜHLE,

    1. Department of Materials and Metallurgical Engineering, The University of Michigan, Ann Arbor, Michigan 48109, and Max-Planck-Institut für Metallforschung, Institut für Werktoffwissenschaften, 7000 Stuttgart 1, Federal Republic of Germany
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      Member, the American Ceramic Society.

    • Max-Planck-Institut für Metallforschung.

  • T.-Y. TIEN

    1. Department of Materials and Metallurgical Engineering, The University of Michigan, Ann Arbor, Michigan 48109, and Max-Planck-Institut für Metallforschung, Institut für Werktoffwissenschaften, 7000 Stuttgart 1, Federal Republic of Germany
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    • *

      Member, the American Ceramic Society.

    • The University of Michigan.


  • Supported by the U. S. Department of Energy, Office of Basic Energy Science, Division of Materials Science, under Contract No. DE-FG02–84–ER45069 at the University of Michigan. At the time that the microscopy was done, D. A. B. was at the Max-Planck Institute under the support of a Fulbright fellowship.

Abstract

Precise determinations of the variation in Al concentration in β-sialon grains of the garnet and cordierite sialon systems were made by means of quantitative energy-dispersive X-ray analysis in an analytical electron microscope. Different signs of the concentration gradients in the grain indicate differences in secondary crystallization mechanisms, while Al distributions with respect to grain size indicate a changing glass-silicon nitride compatability during crystallization. The technique was also applied to the glassy grain-boundary phase allowing the determination of the glass-forming region of the cor-dierite-sialon system. A detailed evaluation of errors in analytical transmission electron microscopy (AEM) is described.

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