Member, American Ceramic Society.
Nanometer-Scale Variations in Interface Potential by Scanning Probe Microscopy
Article first published online: 21 DEC 2004
Journal of the American Ceramic Society
Volume 82, Issue 7, pages 1941–1944, July 1999
How to Cite
Huey, B. D., Lisjak, D. and Bonnell, D. A. (1999), Nanometer-Scale Variations in Interface Potential by Scanning Probe Microscopy. Journal of the American Ceramic Society, 82: 1941–1944. doi: 10.1111/j.1151-2916.1999.tb02023.x
V. Dravid—contributing editor
Authors BDH and DAB were supported by the Department of Energy, Office of Basic Energy Sciences, under Grant No. DEFG01-90ER45428. Author DL was supported by the Ministry of Science and Technology of the Republic of Slovenia.
Presented in part at the 100th Annual Meeting of the American Ceramic Society, Cincinnati, OH, May 4, 1998 (Basic Science Division, Paper No. BS04-002-98).
- Issue published online: 21 DEC 2004
- Article first published online: 21 DEC 2004
- Manuscript No. 190182. Received May 20, 1998; approved December 28, 1998.
The local electrical potential at individual grain boundaries and the potential distributions across polycrystalline samples have been measured by using scanning surface potential imaging with an atomic force microscope. Individual grain boundaries are isolated for measurement by micropatterning an array of contacts onto the surface of a ZnO-based varistor material. Quantification of the voltage dependence of the local voltage decrease and resistivity is illustrated. Comparisons are made by using optical and electron microscopy and spectroscopy. On a larger scale, potential distributions are mapped in a polycrystalline ZnO-NiO system that exhibits positive temperature coefficient of resistivity behavior.