Advertisement

Effect of Electric Field on the Migration of Grain Boundaries in Alumina

Authors

  • Jin-Wook Jeong,

    1. School of Metallurgical and Materials Engineering, Yeungnam University, Kyongsan, Kyongbuk 712–749, Korea
    Search for more papers by this author
  • Joo-Hwan Han,

    1. School of Metallurgical and Materials Engineering, Yeungnam University, Kyongsan, Kyongbuk 712–749, Korea
    Search for more papers by this author
    • *

      Member, American Ceramic Society.

  • Doh-Yeon Kim

    1. Creative Research Initiative Center for Microstructure Science of Materials and School of Materials Science and Engineering, College of Engineering (400), Seoul National University, Seoul 151–742, Korea
    Search for more papers by this author
    • *

      Member, American Ceramic Society.


  • Y.-M. Chiang—contributing editor

  • Supported by the Korean Ministry of Science and Technology, through the Nanostructure Technology Research Project.

Abstract

The effect of an external electric field on the grain-boundary migration in Al2O3 ceramics has been investigated. The boundary migration is dependent on the direction and magnitude of the applied bias, and the observed boundary migration behavior is attributed to the presence of an electrostatic potential that inherently forms at the grain boundaries of Al2O3 ceramics. The results give experimental evidence that the boundary phenomena in oxide ceramics are related to the grain-boundary potential.

Ancillary