Member, American Ceramic Society.
Effect of Electric Field on the Migration of Grain Boundaries in Alumina
Version of Record online: 21 DEC 2004
Journal of the American Ceramic Society
Volume 83, Issue 4, pages 915–918, April 2000
How to Cite
Jeong, J.-W., Han, J.-H. and Kim, D.-Y. (2000), Effect of Electric Field on the Migration of Grain Boundaries in Alumina. Journal of the American Ceramic Society, 83: 915–918. doi: 10.1111/j.1151-2916.2000.tb01294.x
Y.-M. Chiang—contributing editor
Supported by the Korean Ministry of Science and Technology, through the Nanostructure Technology Research Project.
- Issue online: 21 DEC 2004
- Version of Record online: 21 DEC 2004
- Manuscript No. 189749. Received November 13, 1998; approved September 14, 1999.
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