Precision of stereological planar area predictors

Authors

  • KIÊN KIÊU,

    1. Unité Mathématiques et Informatique Appliquées, Institut National de la Recherche Agronomique, Domaine de Vilvert, 78352 Jouy-en-Josas Cedex, France
      *Modal’X, bâtiment G, Université Paris-X, 200 avenue de la République, 92001 Nanterre Cedex, France
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  • and * MARIANNE MORA

    1. Unité Mathématiques et Informatique Appliquées, Institut National de la Recherche Agronomique, Domaine de Vilvert, 78352 Jouy-en-Josas Cedex, France
      *Modal’X, bâtiment G, Université Paris-X, 200 avenue de la République, 92001 Nanterre Cedex, France
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Kiên Kiêu. Tel: +33 (0) 134 65 2816; fax: +33 (0) 134 65 2217; e-mail: kien.kieu@jouy.inra.fr

Summary

Total planar area can be estimated based on sampling by a lattice of figures (e.g. point patterns, line segments, quadrats). General formulae are provided for the approximation of mean squared errors. The approximation formulae are products of the boundary length and of a parameter that depends only on the sampling scheme. An R package is provided by the authors for the numerical computation of the mean squared error formulae. The speed of convergence of the mean squared error approximation is assessed on the basis of several simulations. Several sampling schemes are compared in view of the approximated mean squared errors.

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