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Preparation of TEM samples of metal–oxide interface by the focused ion beam technique

  1. S. ABOLHASSANI,
  2. PHILIPPE GASSER

Article first published online: 7 JUL 2006

DOI: 10.1111/j.1365-2818.2006.01599.x

Issue

Journal of Microscopy

Journal of Microscopy

Volume 223, Issue 1, pages 73–82, July 2006

Additional Information

How to Cite

ABOLHASSANI, S. and GASSER, P. (2006), Preparation of TEM samples of metal–oxide interface by the focused ion beam technique. Journal of Microscopy, 223: 73–82. doi: 10.1111/j.1365-2818.2006.01599.x

Author Information

  1. Paul Scherrer Institut, Laboratory for Materials Behaviour, 5232 Villigen-PSI Switzerland *Swiss Federal Institute for Materials Testing and Research: EMPA, Überlandstrasse 129, CH-8600 Dübendorf, Switzerland

* Sousan Abolhassani. Tel: +41 56 3102191; fax: +41 56 3102205; e-mail: sousan.abolhassani@psi.ch

Publication History

  1. Issue published online: 7 JUL 2006
  2. Article first published online: 7 JUL 2006
  3. Received 8 September 2004; accepted 13 February 2006

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Keywords:

  • Energy dispersive X-ray spectrometer (EDS) analysis by TEM;
  • focused ion beam (FIB);
  • irradiated Zircaloy-4;
  • ‘Lift-out’;
  • metal–oxide interface;
  • TEM;
  • TEM specimen preparation

Summary

This paper describes a procedure to prepare metal–oxide interfaces for transmission electron microscopy by the focused ion beam technique. The advantage of this procedure is to allow the observation of metal–oxide interfaces of irradiated samples with a homogeneous thickness without the need to have an instrument inside laboratories that are specialized for the manipulation of irradiated materials. A transmission electron microscopy sample is prepared by this method and analysed.

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