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Keywords:

  • Energy dispersive X-ray spectrometer (EDS) analysis by TEM;
  • focused ion beam (FIB);
  • irradiated Zircaloy-4;
  • ‘Lift-out’;
  • metal–oxide interface;
  • TEM;
  • TEM specimen preparation

Summary

This paper describes a procedure to prepare metal–oxide interfaces for transmission electron microscopy by the focused ion beam technique. The advantage of this procedure is to allow the observation of metal–oxide interfaces of irradiated samples with a homogeneous thickness without the need to have an instrument inside laboratories that are specialized for the manipulation of irradiated materials. A transmission electron microscopy sample is prepared by this method and analysed.