Preparation of TEM samples of metal–oxide interface by the focused ion beam technique
Article first published online: 7 JUL 2006
Journal of Microscopy
Volume 223, Issue 1, pages 73–82, July 2006
How to Cite
ABOLHASSANI, S. and GASSER, P. (2006), Preparation of TEM samples of metal–oxide interface by the focused ion beam technique. Journal of Microscopy, 223: 73–82. doi: 10.1111/j.1365-2818.2006.01599.x
- Issue published online: 7 JUL 2006
- Article first published online: 7 JUL 2006
- Received 8 September 2004; accepted 13 February 2006
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