SEARCH

SEARCH BY CITATION

References

  • Akanine-Möller, T. & Haines, E. (2002) Real-Time Rendering, 2nd edn. A. K. Peters, Massachusetts , USA . ISBN 156881-182-9.
  • Alam, M.N., Blackman, M. & Pashley, D.W. (1954) High angle Kikuchi patterns. Proc. R. Soc. London Ser. 221A, 224242.
  • Arzoumanian, Z., Holmberg, J. & Norman, B. (2005) An astronomical pattern-matching algorithm for computer-aided identification of whale sharks Rhincodon typus. J. Appl. Ecol. 42, 9991011.
  • Baba-Kishi, K. & Dingley, D.J. (1989) Application of backscatter Kikuchi diffraction in the scanning electron microscope to the study of NiS2. J. Appl. Cryst. 22, 189200.
  • Biggin, S. & Dingley, D.J. (1977) A general method for locating the X-ray source point in Kossel diffraction. J. Appl. Cryst. 10, 376385.
  • Boersch, H. (1937) Über Bänder bei Elektronenbeugung. Z. Techn. Phys. 18, 574578.
  • Coates, D.G. (1967) Kikuchi-like reflection patterns obtained with the scanning electron microscope. Phil. Mag. 16, 11791184.
  • Day, A.P. (1993) Developments in the EBSP Technique and Their Application to Grain Imaging. PhD thesis, University of Bristol.
  • Day, A.P. & Shafirstein, G. (1996) Assessment of local residual strain by electron backscatter patterns and nanoindentation. Mater. Sci. Technol. 12, 873.
  • De Graef, M. (1998) A novel way to represent the 32 crystallographic point groups. J. Mater. Educ. 20, 3142.
  • De Graef, M. (2003) Introduction to Conventional Transmission Electron Microscopy. Cambridge University Press, Cambridge , UK . ISBN 0-521-62006-6.
  • De Graef, M. & McHenry, M.E. (2007) Structure of Materials: An Introduction to Crystallography, Diffraction, and Symmetry. Cambridge University Press, Cambridge , UK . ISBN 978-0-521-65151-6.
  • Dingley, D.J. (1981) A comparison of diffraction techniques for the SEM. Scanning Electron Microsc. 5, 273286.
  • Dingley, D.J. (1985) Report on an Investigation of the Use of Electron Backscatter Diffraction in the Study of Precipitation. Department of Physics, University of Bristol .
  • Dingley, D.J. & Baba Kishi, K. (1986) Extended use of EBSPs for crystallography in the SEM. Proceedings of the XIth International Congress on Electron Microscopy, pp. 741742. Kyoto .
  • Dingley, D.J. (1989) Developments in on-line crystal orientation determination. Inst. Phys. Conf. Ser. 98, 473476.
  • Dingley, D.J., Baba-Kishi, K.Z. & Randle, V. (1995) Atlas of Backscattering Kikuchi Diffraction Patterns. Institute of Physics Publishing, Bristol, UK. ISBN 0-7503-021207.
  • Giacovazzo, C., Monaco, H.L., Viterbo, D., Scordari, F., Gilli, G., Zanotti, G. & Catti, M. (1992) Fundamentals of Crystallography. IUCr, Oxford University Press, Oxford, UK. ISBN 0-19-855578-4.
  • Goehner, R.P. & Michael, J.R. (1996) Phase identification in a scanning electron microscope using backscattered electron Kikuchi patterns. J. Res. Natl. Inst. Stand. Technol. 101, 301308.
  • Gomes, J., Darsa, L., Costa, B. & Velho, L. (1999) Warping and Morphing of Graphical Objects. MorganKaufmann, San Francisco, USA. ISBN 1-55860-464–2.
  • Groth, E.J. (1986) A pattern-matching algorithm for two-dimensional coordinate lists. Astron. J. 91, 12441248.
  • Hansen, A.J. (2006) Visualizing Quaternions. MorganKaufmann, San Francisco, USA. ISBN 0-12-088400-3.
  • Hartley, R. & Zissermann, A. (2003) Multiple View Geometry in Computer Vision, 2nd edn. Cambridge University Press, Cambridge, UK. ISBN 0-521-54051-8.
  • Hawkes, P.W., ed. (2007) Advances in Imaging and Electron Physics, Vol. 145, Academic Press, California, USA. ISBN 0-12-373907-1.
  • Heckbert, P.S. (1989) Fundamentals of Texture Mapping and Image Warping. Master's thesis, Department of Electrical Engineering and Computer Science, University of California.
  • Hough, P.V.C. (1962) Method and Means for Recognizing Complex Patterns, US patent 3,069,654.
  • Imiya, A., Sugaya, H., Torii, A. & Mochizuki, Y. (2005) Variational analysis of spherical images. Computer Analysis of Images and Patterns. Proceedings of the 11th International Conference, CAIP 2005, p.p. 104–111. Versailles , France , Springer.
  • Joy, D.C. (1974) Electron channelling patterns in the scanning electron microscope. Quantitative Scanning Electron Microscopy (ed. by D.B.Holt, M.D.Muir, I.M.Boswarva and P.R.Grant), p.p. 131182. Academic Press, New York .
  • Krieger Lassen, N.C. (1994) Automated Determination of Crystal Orientations from Electron Backscattering Patterns. PhD thesis, Institute of Mathematical Modelling, The Technical University of Denmark.
  • Krieger Lassen, N.C., Juul Jensen, D. & Conradsen, K. (1992) Image processing procedures for analysis of electron backscatter patterns. Scanning Microsc. 6, 115121.
  • Kunszt, P.Z., Szalay, A.S. & Thakar, A.R. (2001) The hierarchical triangular mesh. Mining the Sky (ed. by A.J.Banday, S.Zaroubi and M.Bartelmann), pp. 631637. Proceedings of the MPA/ESO/MPE Workshop, Garching, Conference Proceedings, ESO Symposia, Springer-Verlag, Berlin , Heidelberg .
  • Leavers, V.F. & Boyce, J.F. (1986) An implementation of the Hough Transform Using a Linear Array Processor in Conjunction with a PDP/11 Microprocessor, NPL report DITC 74/86.
  • Leavers, V.F. (1992) Shape Detection in Computer Vision Using the Hough Transform. Springer-Verlag, New York . ISBN 3-540-19723-0.
  • Lloyd, G.E. & Ferguson, C.C. (1986) A spherical electron-channelling pattern map for use in quartz petrofabric analysis. J. Struct. Geol. 8(5), 517526.
  • Maurice, C. & Fortunier, R. (2007) Presentation: a new algorithm for the automatic detection of conics. Application to EBSD and Kossel Microdiffraction; RMS EBSD meeting 2007, New Lanark , Scotland .
  • Michael, J.R. & Goehner, R.P. (1993) Crystallographic phase identification in the scanning electron microscope: backscattered electron Kikuchi patterns imaged with a CCD-based detector. MSA Bull. 23, 168.
  • Michael, J.R. & Eades, J.A. (2000) Use of reciprocal lattice layer spacing in electron backscatter diffraction pattern analysis. Ultramicroscopy 81, 6781.
  • McKie, D. & McKie, C. (1986) Essentials of Crystallography. Blackwell Scientific Publications, Oxford, UK. ISBN 0-632-01574-8.
  • McReynolds, T. & Blythe, D. (2005) Advanced Graphics Programming Using OpenGL. MorganKaufmann, San Francisco, USA. ISBN 1-55860-659-9.
  • Nishikawa, S. & Kikuchi, S. (1928) The diffraction of cathode rays by calcite. Proc. Imperial Acad. (of Japan) 4, 475477.
  • Le Page, Y. (1992) Ab-initio primitve cell parameters from single convergent-beam electron diffraction patterns: a converse route to the identification of microcrystals with electrons. Microsc. Res. Tech. 21, 158165.
  • Morawiec, A. (2004) Orientations and Rotations: Computations in Crystallographic Textures. Springer, Berlin, Germany. ISBN 3-540-40734-0.
  • Peng, L.-M., Dudarev, S.L. & Whelan, M.J. (2004) High-Energy Electron Diffraction and Microscopy. Oxford science Publications, Oxford, UK. ISBN 0-19-8500742.
  • Prior, D.J. & Wheeler, J. (1999) Feldspar fabrics in a greenschist facies albite-rich mylonite from electron backscatter diffraction. Tectonophysics 303, 2949.
  • Quested, P.N., Henderson, P.J. & McLean, M. (1988) Observations of deformation and fracture heterogeneities in a nickel-base superalloy using electron back scattering patterns. Acta Metall. 36, 27432752.
  • Randle, V. (1992) Microtexture Determination and Its Applications. The Institute of Materials, London , UK . ISBN 0-901716-395.
  • Randle, V. (2003) Microtexture Determination. Institute of Materials, London . ISBN 1-902653-82-3.
  • Randle, V. & Engler, O. (2000) Introduction to Texture Analysis: Macrotexture, Microtexture and Orientation Mapping. Gordon and Breach, Amsterdam . ISBN 90-5699-224-4.
  • Reimer, L., Heilers, U. & Saliger, G. (1986) Kikuchi band contrast in diffraction patterns recorded by transmitted and backscattered electrons. Scanning 8, 101118.
  • Reimer, L. (1993) Image Formation in Low Voltage Scanning Electron Microscopy. SPIE Optical Engineering Press, Washington, USA. ISBN 0819412066.
  • Reimer, L. (1998) Scanning Electron Microscopy: Physics of Image Formation and Microanalysis, 2nd edn. Springer, Berlin, Germany. ISBN 3-540-63976-4.
  • Roberts, P.T.E., Chapman, J.N. & MacLeod, A.M. (1982) A CCD-based image recording system for the CTEM. Ultramicroscopy 8, 385396.
  • Samet, H. (1990) The Design and Analysis of Spatial Data Structures. Addison Wesley, Massachusetts, USA. ISBN 0-201-50255-0.
  • Samet, H. (2006) Foundations of Multidimensional and Metric Data Structures. MorganKaufmann, San Francisco, USA. ISBN 0-12-369446-9.
  • Schneider, P.J. & Eberly, D.H. (2003) Geometric Tools for Computer Graphics. MorganKaufmann, San Francisco, USA. ISBN 1-55860-594-0.
  • Schwartz, A.J., Kumar, M. & Adams, B.L. (2000) Electron Backscatter Diffraction in Materials Science. Kluwer Academic, New York, USA. ISBN 0-306-46487-X.
  • Snyder, R.L., Fiala, J. & Bunge, H.J. (1999) Defect and Microstructure Analysis by Diffraction. International Union of Crystallography, Oxford Science Publications, New York, USA. ISBN 0-19-850189-7.
  • Spence, J.C.H. & Zuo, J.M. (1988) Large dynamic range, parallel detection system for electron diffraction and imaging. Rev. Sci. Instrum. 59(9), 21022105.
  • Spence, J.C.H. & Zuo, J.M. (1992) Electron Microdiffraction. Plenum, New York, USA. ISBN 0-306-44262-0.
  • Steeds, J.W. & Vincent, R. (1983) Use of high-symmetry zone axes in electron diffraction in determining crystal point and space groups. J. Appl. Cryst. 16, 317324.
  • Stott, D.E., Wise, M.L.H. & Hutchinson, W.B. (1975) A distortion-free map for use with electron channelling patterns. J. Microsc. 105, 305307.
  • Szalay, A.S., Gray, J., Fekete, G., Kukol, P. & Thakar, A.R. (2005) Indexing the sphere with the hierarchical triangular mesh. Microsoft Research. Technical report MSR-TR-2005-123.
  • Torii, A. & Imiya, A. (2005) The randomized Hough transform for spherical images. Proceedings Computer Analysis of Images and Patterns, 11th International Conference, CAIP 2005, Versailles , France , Springer. ISBN 032-9743.
  • Venables, J.A. & Harland, C.J. (1973) Electron backscattering patterns. A new technique for obtaining crystallographic information in the scanning electron microscope. Phil. Mag. 27, 11931200.
  • Wallace, R.S. (1985) A modified Hough transform for lines in proceedings of the IEEE Computer Vision and Pattern Recognition (CVPR85) conference. pp. 665667. San Francisco .
  • Wilkinson, A.J. & Hirsch, P.B. (1997) Electron diffraction based techniques in scanning electron microscopy of bulk materials. Micron 28, 279308.
  • Wilkinson, A.J., Meaden, G. & Dingley, D.J. (2006) High-resolution elastic strain measurement from electron backscatter diffraction patterns: new levels of sensitivity. Ultramicroscopy 106, 307313.
  • Winkelmann, A. (2003) Elektronenbeugungsmethoden zur Strukturanalyse epitaktischer Siliziumkarbidschichten. Dissertation, Jena University, Physikalisch-Astronomische Fakultät.
  • Winkelmann, A., Schröter, B. & Richter, W. (2004) Electron diffraction methods for the analysis of silicon carbide surfaces and the controlled growth of polytype heterostructures. J. Phys. Condens. Matter. 16, S1555S1578.
  • Winkelmann, A., Trager-Cowan, C., Sweeney, F., Day, A.P. & Parbrook, P. (2007) Many-beam dynamical simulation of electron backscatter diffraction patterns. Ultramicroscopy 107(4), 414421.
  • Wolberg, G. (1992) Digital Image Warping, 3rd edn. IEEE Computer Society Press, California , USA . ISBN 0-8186-8944-7.
  • Young, C.T. & Lytton, J.L. (1972) Computer generation and identification of Kikuchi projections. J. Appl. Phys. 43, 14081417.