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Clustering and nearest neighbour distances in atom probe tomography: the influence of the interfaces
Article first published online: 11 JAN 2010
DOI: 10.1111/j.1365-2818.2009.03359.x
© 2010 The Authors Journal compilation © 2010 The Royal Microscopical Society
Additional Information
How to Cite
PHILIPPE, T., COJOCARU-MIRÉDIN, O., DUGUAY, S. and BLAVETTE, D. (2010), Clustering and nearest neighbour distances in atom probe tomography: the influence of the interfaces. Journal of Microscopy, 239: 72–77. doi: 10.1111/j.1365-2818.2009.03359.x
Publication History
- Issue published online: 16 JUN 2010
- Article first published online: 11 JAN 2010
- Received 1 July 2009; accepted 19 November 2009
- Abstract
- Article
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Keywords:
- Atom-probe tomography;
- clustering;
- interface;
- 1NN method;
- nearest neighbour distances;
- statistics
Summary
The statistical 1NN method is an elegant way to derive the composition of small B-enriched clusters in a random AB solid solution from 3D atomic fields. An extension of this method is proposed that includes the contribution of interface region and provides an estimate of the core composition of clusters. This model is applied to boron-implanted silicon containing boron-enriched clusters. A comparison with the previous model is performed. This new approach gives relevant information, i.e. the core composition of clusters and the cluster–matrix interface width.