SEARCH

SEARCH BY CITATION

References

  • Bas, P., Bostel, A., Deconihout, B. & Blavette, D. (1995) A general protocol for the reconstruction of 3D atom probe data. Appl. Surf. Sci. 87, 298304.
  • Bunton, J.H., Olson, J.D., Lenz, D.R. & Kelly, T.F. (2007) Advances in pulsed-laser atom probe: instrument and specimen design for optimum performance. Microsc. Microanal. 13, 418427.
  • Cash, J.R. & Karp, A.H. (1990) A variable order runge-kutta method for initial value problems with rapidly varying right-hand sides. ACM Trans. Math. Softw. 16, 201222.
  • Cerezo, A., Petford-Long, A.K., Larson, D.J., Pinitsoontorn, S. & Singleton, E.W. (2006) The formation mechanism of aluminium oxide tunnel barriers. J. Mater. Sci. 41, 78437852.
  • Chiaramonti, A.N., Schreiber, D.K., Egelhoff, W.F., Seidman, D.N. & Petford-Long, A.K. (2008) Effects of annealing on local composition and electrical transport correlations in MgO-based magnetic tunnel junctions. Appl. Phys. Lett. 93, 103113.
  • Drechsler, M. & Wolf, D. (1958) Zur Analyse von Feldionenmikroscop-Aufnahmen mit atomarer quflösung. In: Proceedings of the 4th International Conference on Electron Microscopy. Springer, Berlin .
  • Geiser, B.P., Larson, D.J., Gerstl, S., Reinhard, D., Kelly, T.F., Prosa, T.J. & Olson, D. (2009a) A system for simulation of tip evolution under field evaporation. Microsc. Microanal.
  • Geiser, B.P., Larson, D.J., Oltman, E., Gerstl, S., Reinhard, D., Kelly, F.F. & Prosa, T.J. (2009b) Wide-field-of-view atom probe reconstruction. Microsc. Microanal. 15, 292293.
  • Gorman, B.P., Diercks, D., Salmon, N., Stach, E., Amador, G. & Hartfield, C. (2008) Hardware and Techniques for cross-correlative TEM and atom probe analysis. Microsc. Today 16, 4247.
  • Hackbusch, W. (2003) Multi-Grid Methods and Applications. Springer-Verlag, Berlin .
  • Larson, D.J., Cerezo, A., Martens, R.L., Clifton, P.H., Kelly, T.F., Petford-Long, A.K. & Tabat, N. (2000) Atomic-scale analysis of CoFe/Cu and CoFe/NiFe interfaces. Appl. Phys. Lett. 77, 726728.
  • Larson, D.J., Foord, D.T., Petford-Long, A.K., Liew, H., Blamire, M.G., Cerezo, A. & Smith, G.D.W. (1999a) Field-ion specimen preparation using focused ion-beam milling. Ultramicroscopy 79, 287293.
  • Larson, D.J., Petford-Long, A.K., Cerezo, A. & Smith, G.D.W. (1999b) Three-dimensional atom probe studies of metallic multilayers. Acta Mater. 47, 40194024.
  • Larson, D.J., Petford-Long, A.K., Ma, Y.Q. & Cerezo, A. (2004) Information storage materials: nanoscale characterisation by three-dimensional atom probe analysis. Acta Mater. 52, 28472862.
  • Larson, D.J., Marquis, E.A., Rice, P.M., Prosa, T.J., Geiser, B.P., Yang, S.-H. & Parkin, S.S.P. (2010) Atom probe tomographic imaging of manganese diffusion in annealed magnetic tunnel junctions with MgO tunnel barriers. Appl. Phys. Lett., accepted for publication.
  • Loberg, B. & Norden, H. (1969) Observations of field-evaporation end form of tungsten. Arkiv for Fysik 39, 383395.
  • Meyerheim, H.L., Popescu, R., Hjedrecy, N., Vedpathak, M., Sauvage-Simkin, M., Pinchaux, R., Heinrich, B. & Kirschner, J. (2002) Surface x-ray diffraction analysis of the MgO/Fe(001) interface: evidence for an FeO layer. Phys. Rev. B 65, 144433.1144433.7.
  • Miller, M.K. & Hetherington, M.G. (1991) Local magnification effects in the atom probe. Surf. Sci. 246, 442449.
  • Petersen, T.C. & Ringer, S.P. (2009) Electron tomography using a geometric surface-tangent algorithm: application to atom probe specimen morphology. J. Appl. Phys. 105, 103518103518-9.
  • Petford-Long, A.K., Ma, Y.Q., Cerezo, A., Larson, D.J., Singleton, E.W. & Karr, B.W. (2005) The formation mechanism of aluminum oxide tunnel barriers: Three-dimensional atom probe analysis. J. Appl. Phys. 98, 124904.1124904.6.
  • Pinitsoontorn, S., Cerezo, A., Petford-Long, A.K., Mauri, D., Folks, L. & Carey, M.J. (2008) Three-dimensional atom probe investigation of boron distribution in CoFeB/MgO/CoFeB magnetic tunnel junctions. Appl. Phys. Lett. 93, 071901071901-3.
  • Prosa, T.J., Lawrence, D., Larson, D.J., Olson, J. & Marquis, E.A. (2009) Backside lift-out specimen preparation: reversing the analysis direction in atom probe tomography. Micorsc. Microanal. 15, 298299.
  • Thompson, K., Lawrence, D., Larson, D.J., Olson, J.D., Kelly, T.F. & Gorman, B. (2007) In situ site-specific specimen preparation for atom probe tomography. Ultramicroscopy 107, 131139.
  • Tsong, T.T. (1978) Field ion image formation. Surf. Sci. 70, 211233.
  • Vurpillot, F., Bostel, A., Menand, A. & Blavette, D. (1999) Trajectories of field emitted ions in 3D atom-probe. Eur. Phys. J.-Appl. Phys. 6, 217221.
  • Vurpillot, F., Bostel, A. & Blavette, D. (2000) Trajectory overlaps and local magnification in three-dimensional atom probe. Appl. Phys. Lett. 76, 31273129.
  • Vurpillot, F., Bostel, A. & Blavette, D. (2001) A new approach to the interpretation of atom probe field-ion microscopy images. Ultramicroscopy 89, 137144.
  • Vurpillot, F., Cerezo, A., Blavette, D. & Larson, D.J. (2004a) Modeling image distortions in 3DAP. Microsc. Microanal. 10, 384390.
  • Vurpillot, F., Larson, D. & Cerezo, A. (2004b) Improvement of multilayer analyses with a three-dimensional atom probe. Surf. Interface Anal. 36, 552558.
  • Waugh, A.R., Boyes, E.D. & Southon, M.J. (1975) Field-desorption microscopy and the atom probe. Nature 253, 342343.