SEARCH

SEARCH BY CITATION

References

  • Arslan, I., Marquis, E.A., Homer, M., Hekmaty, M. & Bartelt, N.C. (2008) Towards better 3-D reconstructions by combining electron tomography and atom-probe tomography. Ultramicroscopy 108, 15791585.
  • Bas, P., Bostel, A., Deconihout, B. & Blavette, D. (1995) A general protocol for the reconstruction of 3D atom probe data. Appl. Surf. Sci. 87/88, 298304.
  • Bernardini, F., Mittleman, J., Rushmeier, H., Silva, C. & Taubin, G. (1999) The Ball-Pivoting algorithm for surface reconstruction. IEEE Trans. Vis. Comput. Graph.5, 349359.
  • De Castro, E. & Moriandi, C. (1987) Registration of translated and rotated images using finite Fourier Transforms. IEEE Trans. Pattern Anal. Mach. Intell. PAMI-9 5 (Sept.), 700703.
  • De Geuser, F., Lefebvre, W., Danoix, F., Vurpillot, F., Forbord, B., & Blavette, D. (2007) An improved reconstruction procedure for the correction of local magnification effects in three-dimensional atomb-probe. Surf. Interface Anal. 39, 268272.
  • Dey, T. & Goswami, S. (2003) Tight cocone: a water-tight surface reconstructor. J. Comput. Inf. Sci. Eng. 127134.
  • Dreschler, M. & Wolf, P. (1958) The analysis of field ion micrographs of atomic resolution. InternationalConference in Electron Microscopy, Berlin , Germany .
  • Frank, J. (1992) Electron Tomography: Three-Dimensional Imaging with the Transmission Electron Microscope. Springer, New York .
  • Garland, M. & Heckbert, P. (1998) Simplifying surfaces with color and texture using quadric error. Conference proceedings, IEEE Visualisation. Durham , DC , U.S.A .
  • Gault, B., Moody, M.P., De Geuser, F. et al . (2009) Advances in the calibration of atom probe tomographic reconstruction. J. Appl. Phys. 105, 034913-1–034913-9.
  • Geiser, B.P., Larson, D.J., Oltman, E., Gerstl, S.S., Reinhard, D.A., Kelly, T.F. & Prosa, T.J. (2009) Wide-Field-of-View Atomb Probe Reconstruction. Microsc. Microanal. 15(Suppl. 2), 292293.
  • Geuzaine, C. & Remacle, J. (2009) Gmsh: a three-dimensional finite element mesh generator with built-in pre- and post-processing facilities. Int. J. Numer. Methods Eng. 79, 13091331.
  • Gorman, G., Puthucode, A., Diercks, D.R. & Kaufman, M.J. (2008) Cross-correlative TEM and atom probe analysis of partial crystallisation in NiNbSn metallic glasses. Mater. Sci. Technol. 24, 682688.
  • Kazhdan, M., Bolitho, B. & Hoppe, H. (2006) Poisson surface reconstruction. Eurographics Symposium on Geometry Processsing, Sardinia , Italy .
  • Kelly, F., Larson, D., Thompson, K., Roger, L., Bunton, J., Olson, J. & Gorman, B. (2007) Atom probe tomography of electronic materials. Annu. Rev. Mater. Sci. 37, 681727.
  • Klasing, K., Althoff, D., Wollerr, D. & Buss, M. (2009) Comparison of surface normal estimation methods for range sensing applications. IEEE Int. Conf. Robot. Autom., Kobe, Japan.
  • Klugin C.D. & Hines, D.C. (1975) The phase correlation image alignment method. In proceedings of the IEEE 1975 International Conference on Cybernetics and Society (Sept.) IEEE, pp. 163165. New York .
  • Larson, D. & Stiller, K. (2007) Summary of the Atom Probe Tomography Workshop IFES 2006 July 18, 2006 Guilin, China. Ultramicroscopy 107, 813818.
  • Larson, D.J., Prosa, T.J., Kostrna, S. et al . (2006) A correlative study of an iron-base superalloy using transmission electron microscopy and atom probe tomography. Microsc. Microanal. 12(Suppl. 2), 17481749.
  • Leberl, F., Gruber, M., Kellerer-Pirklbauer, W., Pinz, A., Uray, P. & Paar, G. (1996) Surface reconstruction. Int. Arch. Photogramm. Remote Sens. 31 B3, 421428.
  • Markoe, A. (2006) Encyclopedia of Mathematics and Its Applications: Analytic Tomography. Cambridge University Press, Cambridge , U.K.
  • Marquis, E.A., Geiser, B.P., Prosa, T.J. & Larson, D.J. (2010) Evolution of tip shape during field evaporation of complex multilayer structures. J. Microsc. 241, 225233.
  • Midgley, P.A. & Weyland, M. (2003) 3D electron microscopy in the physical sciences: the development of Z-contrast and EFTEM tomography. Ultramicroscopy 96, 413431.
  • Miller, M., Cerezo, A. & Hetherington, M. (1996) Smith, Atom Probe Filed Ion Microscopy. Oxford Science Publications, Oxford , U.K.
  • Niewieczerzal, D., Oleksy, C. & Szczepkowicz, A. (2010) Image deformation in field ion microscopy of faceted crystals. Ultramicroscopy 110, 234241.
  • Oberdorfer, C. & Schmitz, G. (2011) On the field evaporation behavior of dielectric materials in three-dimensional atom probe: a numeric simulation. Microsc. Microanal. 17, 1525.
  • Petersen, T.C. & Ringer, S.P. (2009) Electron tomography using a geometric surface-tangent algorithm: application to atom probe specimen morphology. J. Appl. Phys. 105, 103518.
  • Petersen, T.C. & Ringer, S.P. (2010) An electron tomography algorithm for reconstructing 3D morphology using surface tangents of projected scattering interfaces. Comput. Phys. Commun. 181(3), 676682.
  • Press, W.H., Flannery, B.P. & Teukolsky, S.A. (1992) Numerical Recipes in C: The Art of Scientific Computing. Cambridge University Press, Cambridge , U.K.
  • Ringer, S.P. & Hono, K. (2000) Microstructural evolution and age hardening in aluminium alloys: atom probe field-ion microscopy and transmission electron microscopy studies. Mater. Charact. 44(1–2), 101131.
  • Smith, R. & Walls, J.M. (1978) Ion trajectories in the field-ion microscope. J. Appl. Phys. D 11, 409419.
  • Thompson, G., Genc, A., Morris, R., Torres, K. & Fraser, H. (2009) Correlation between TEM imaging and microanalysis for atom probe reconstruction verification. Microsc. Microanal. 15(Suppl. 12), 250251.
  • Vurpillot, F., Bostel, A. & Blavette, D. (2001) A new approach to the interpretation of atom probe field-ion microscopy images. Ultramicroscopy 89, 137144.