Symmetry Detection Using Feature Lines
Article first published online: 27 MAR 2009
© 2008 The Author(s) Journal compilation © 2008 The Eurographics Association and Blackwell Publishing Ltd.
Computer Graphics Forum
Volume 28, Issue 2, pages 697–706, April 2009
How to Cite
Bokeloh, M., Berner, A., Wand, M., Seidel, H.-P. and Schilling, A. (2009), Symmetry Detection Using Feature Lines. Computer Graphics Forum, 28: 697–706. doi: 10.1111/j.1467-8659.2009.01410.x
- Issue published online: 27 MAR 2009
- Article first published online: 27 MAR 2009
- Computer Graphics [I.3.5]: Computational Geometry and Object Modeling—Artificial Intelligence [I.2.10]: Vision and Scene Understanding
In this paper, we describe a new algorithm for detecting structural redundancy in geometric data sets. Our algorithm computes rigid symmetries, i.e., subsets of a surface model that reoccur several times within the model differing only by translation, rotation or mirroring. Our algorithm is based on matching locally coherent constellations of feature lines on the object surfaces. In comparison to previous work, the new algorithm is able to detect a large number of symmetric parts without restrictions to regular patterns or nested hierarchies. In addition, working on relevant features only leads to a strong reduction in memory and processing costs such that very large data sets can be handled. We apply the algorithm to a number of real world 3D scanner data sets, demonstrating high recognition rates for general patterns of symmetry.