Authors are also affiliated with CREI, BSGE, CREMeD, and CEPR; CEPR; and CEPR, respectively.
The Ins and Outs of Unemployment: An Analysis Conditional on Technology Shocks*
Article first published online: 10 OCT 2012
© 2012 The Author(s). The Economic Journal © 2012 Royal Economic Society
The Economic Journal
Volume 123, Issue 569, pages 515–539, June 2013
How to Cite
Canova, F., Lopez-Salido, D. and Michelacci, C. (2013), The Ins and Outs of Unemployment: An Analysis Conditional on Technology Shocks. The Economic Journal, 123: 515–539. doi: 10.1111/j.1468-0297.2012.02548.x
Corresponding author: Claudio Michelacci, CEMFI, Casado del Alisal 5, 28014, Madrid, Spain. Email: email@example.com.
We thank Andrew Scott (the Editor), four anonymous referees, Marios Angeletos, Roc Armenter, Robert Barro, Olivier Blanchard, Jesus Fernandez-Villaverde, Robert Hall, Jim Nason, Ivan Werning, Tao Zha and participants of numerous seminars and conferences for comments and suggestions. We also thank Jason Cummins, Gianluca Violante, Robert Shimer, Pau Rabanal, Sergio Rebelo, Gary Solon and Ryan Michaels for kindly making their data available to us. The opinions expressed here are solely those of the authors and do not necessarily reflect the views of the Board of Governors of the Federal Reserve System or of anyone else associated with the Federal Reserve System. Canova acknowledges the financial support of the BGSE and of the Spanish Ministry of Science and Technology (grant ECO2009-08556). Claudio Michelacci acknowledges the financial support of the European Research Council (ERC Advanced Grant 293692). Previous versions of the paper have circulated under the title ‘The ins and out of unemployment: a conditional analysis’ and ‘Schumpeterian Technology Shocks’.
- Issue published online: 7 JUN 2013
- Article first published online: 10 OCT 2012
- Accepted manuscript online: 6 JUL 2012 12:43PM EST
- Submitted: 22 October 2009, Accepted: 6 June 2012
Options for accessing this content:
- If you have access to this content through a society membership, please first log in to your society website.
- If you would like institutional access to this content, please recommend the title to your librarian.
- Login via other institutional login options http://onlinelibrary.wiley.com/login-options.
- You can purchase online access to this Article for a 24-hour period (price varies by title)
- If you already have a Wiley Online Library or Wiley InterScience user account: login above and proceed to purchase the article.
- New Users: Please register, then proceed to purchase the article.
Type your institution's name in the box below. If your institution is a Wiley customer, it will appear in the list of suggested institutions and you will be able to log in to access content. Some users may also log in directly via OpenAthens.
Please note that there are currently a number of duplicate entries in the list of institutions. We are actively working on fixing this issue and apologize for any inconvenience caused.
Registered Users please login:
- Access your saved publications, articles and searches
- Manage your email alerts, orders and subscriptions
- Change your contact information, including your password
Please register to:
- Save publications, articles and searches
- Get email alerts
- Get all the benefits mentioned below!