Franzen is at the University of Texas at Dallas, Rodgers is at New York University, and Simin is at Pennsylvania State University. The authors are grateful for comments from Edward Altman, Diane Denis, Stacie Laplante, Michael Lemmon, Karl Muller, Micah Officer, and the workshop participants at the University of Texas at Dallas, with special thanks to Robert Stambaugh and an anonymous referee.
Measuring Distress Risk: The Effect of R&D Intensity
Version of Record online: 28 NOV 2007
© 2007 the American Finance Association
The Journal of Finance
Volume 62, Issue 6, pages 2931–2967, December 2007
How to Cite
FRANZEN, L. A., RODGERS, K. J. and SIMIN, T. T. (2007), Measuring Distress Risk: The Effect of R&D Intensity. The Journal of Finance, 62: 2931–2967. doi: 10.1111/j.1540-6261.2007.01297.x
- Issue online: 28 NOV 2007
- Version of Record online: 28 NOV 2007
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