The Accelerated Failure Time Model Under Biased Sampling
Article first published online: 30 NOV 2009
© 2009, The International Biometric Society
Volume 66, Issue 4, pages 1306–1308, December 2010
How to Cite
Mandel, M. and Ritov, Y. (2010), The Accelerated Failure Time Model Under Biased Sampling. Biometrics, 66: 1306–1308. doi: 10.1111/j.1541-0420.2009.01366_1.x
- Issue published online: 30 NOV 2009
- Article first published online: 30 NOV 2009
- Received July 2009. Revised July 2009. Accepted July 2009.
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