A Unified Approach to Multi-item Reliability
Article first published online: 11 JAN 2010
© 2010, The International Biometric Society
Volume 66, Issue 4, pages 1061–1068, December 2010
How to Cite
Alonso, A., Laenen, A., Molenberghs, G., Geys, H. and Vangeneugden, T. (2010), A Unified Approach to Multi-item Reliability. Biometrics, 66: 1061–1068. doi: 10.1111/j.1541-0420.2009.01373.x
- Issue published online: 11 JAN 2010
- Article first published online: 11 JAN 2010
- Received April 2008. Revised September 2009. Accepted October 2009.
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