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Radiation-Induced Surface Conductivity in an Alkaline-Earth Boroaluminosilicate Glass Measured with Elevated-Temperature Scanning Probe Microscopy
Article first published online: 12 MAY 2005
DOI: 10.1111/j.1551-2916.2005.00266.x
Additional Information
How to Cite
Polking, M. J. and Umbach, C. C. (2005), Radiation-Induced Surface Conductivity in an Alkaline-Earth Boroaluminosilicate Glass Measured with Elevated-Temperature Scanning Probe Microscopy. Journal of the American Ceramic Society, 88: 2442–2446. doi: 10.1111/j.1551-2916.2005.00266.x
Publication History
- Issue published online: 12 MAY 2005
- Article first published online: 12 MAY 2005
- Manuscript No. 10933. Received March 23, 2004; approved November 16, 2004.
- Abstract
- Article
- References
- Cited By
A 50 mW 325 nm He:Cd laser was used to irradiate the fracture surface of a commercial alkaline-earth boroaluminosilicate display glass (Corning Code 1737) held at temperatures above 800 K. After this treatment, the surface of the glass was found to be conductive for several hours in a temperature range between room temperature and 850 K. The conductivity shows an activation energy of 0.18 eV. Scanning tunneling spectroscopy measurements indicate that the glass surface is semiconducting with a bandgap of ∼4.4 eV. It is possible to form topographical images of the surface of the glass using the electron tunneling current; the observed topography corresponds to that acquired using atomic force imaging from the same area.