*Member, The American Ceramic Society.
Combined Jonker and Ioffe Analysis of Oxide Conductors and Semiconductors
Article first published online: 27 SEP 2010
© 2010 The American Ceramic Society
Journal of the American Ceramic Society
Volume 94, Issue 1, pages 187–193, January 2011
How to Cite
Zhu, Q., Hopper, E. M., Ingram, B. J. and Mason, T. O. (2011), Combined Jonker and Ioffe Analysis of Oxide Conductors and Semiconductors. Journal of the American Ceramic Society, 94: 187–193. doi: 10.1111/j.1551-2916.2010.04047.x
W.-Y. Ching—contributing editor
This work was supported by the U. S. Department of Energy, Office of Basic Energy Sciences as part of an Energy Frontier Research Center under grant no. DE-SC0001059. EMH and TOM acknowledge the support of the MRSEC program of the National Science Foundation (DMR-0502513) at the Materials Research Center of Northwestern University. This work made use of central facilities of the Northwestern University Materials Research Center.
- Issue published online: 5 JAN 2011
- Article first published online: 27 SEP 2010
- Manuscript No. 27879. Received April 19, 2010; approved June 28, 2010.
Jonker plots (Seebeck coefficient versus logarithm of conductivity) have been utilized to obtain the product of the density of states (DOS) and mobility (μ) in oxide semiconductors, from which the maximum electrical conductivity can be estimated for degenerate transparent conducting oxide (TCO) applications. In addition, the DOS–μ product can be utilized to predict the maximum achievable “power factor” (PF, Seebeck coefficient squared times conductivity) for oxide semiconductors. The PF is an important parameter governing the figure of merit for thermoelectric oxide (TEO) applications. The procedure employs an analysis developed by Ioffe, and provides an important screening tool for oxide (and other) thermoelectric materials, based upon data from polycrystalline ceramic specimens. Several oxides, including known transparent conductors, are considered as TCO and TEO case studies in the present work.