Trace element depth profiles in presolar silicon carbide grains
Article first published online: 24 OCT 2012
© The Meteoritical Society, 2012
Meteoritics & Planetary Science
Volume 47, Issue 10, pages 1624–1643, October 2012
How to Cite
KING, A. J., HENKEL, T., ROST, D. and LYON, I. C. (2012), Trace element depth profiles in presolar silicon carbide grains. Meteoritics & Planetary Science, 47: 1624–1643. doi: 10.1111/j.1945-5100.2012.01426.x
- Issue published online: 8 NOV 2012
- Article first published online: 24 OCT 2012
- (Received 09 October 2010; revision accepted 08 September 2012)
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