Low Dielectric Loss and Good Dielectric Thermal Stability of xNd(Zn1/2Ti1/2)O3–(1−x)Ba0.6Sr0.4TiO3 Thin Films Fabricated by Sol–Gel Method
Article first published online: 12 DEC 2012
© 2012 The American Ceramic Society
Journal of the American Ceramic Society
Volume 96, Issue 3, pages 820–824, March 2013
How to Cite
Sun, X., Yang, Y., Zhang, Q., Hou, S., Huang, C., Hu, Z., Zou, J., Li, M., Peng, T., Zhao, X.-z. (2013), Low Dielectric Loss and Good Dielectric Thermal Stability of xNd(Zn1/2Ti1/2)O3–(1−x)Ba0.6Sr0.4TiO3 Thin Films Fabricated by Sol–Gel Method. Journal of the American Ceramic Society, 96: 820–824. doi: 10.1111/jace.12112
- Issue published online: 17 MAR 2013
- Article first published online: 12 DEC 2012
- Manuscript Accepted: 31 OCT 2012
- Manuscript Received: 19 JUL 2012
- National Natural Science Foundation of China. Grant Number: 50902085
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