Impedance Spectroscopy Characterization in Bipolar Ta/MnOx/Pt Resistive Switching Thin Films
Version of Record online: 29 JAN 2013
© 2013 The American Ceramic Society
Journal of the American Ceramic Society
Volume 96, Issue 4, pages 1234–1239, April 2013
How to Cite
Park, C.-R., Choi, S.-Y., You, Y.-H., Yang, M. K., Bae, S.-M., Lee, J.-K., Hwang, J.-H. (2013), Impedance Spectroscopy Characterization in Bipolar Ta/MnOx/Pt Resistive Switching Thin Films. Journal of the American Ceramic Society, 96: 1234–1239. doi: 10.1111/jace.12185
- Issue online: 9 APR 2013
- Version of Record online: 29 JAN 2013
- Manuscript Accepted: 21 DEC 2012
- Manuscript Received: 22 MAY 2012
- Ministry of Education, Science and Technology. Grant Numbers: 2011K000607, 2010-0009179
- KIST. Grant Number: 2E22731
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