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Edge Chipping Resistance of Alumina/Zirconia Laminates

Authors


Author to whom correspondence should be addressed. e-mail: geoq@nist.gov

Abstract

The edge chipping test was used to measure the fracture resistance of alumina/alumina-zirconia laminated structures. Tailored, symmetrical laminated structures were prepared with a variety of layer thickness. The laminates had a significantly greater edge chipping resistance. Laminates with thin layers were just as effective in impeding edge chips as laminates with thick layers.

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