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Dielectric Properties and Impedance Analysis of K0.5Na0.5NbO3Ba2NaNb5O15 Ceramics with Good Dielectric Temperature Stability

Authors

  • Xiuli Chen,

    Corresponding author
    1. State Key Laboratory Breeding Base of Nonferrous Metals and Specific Materials Processing, Key Laboratory of Nonferrous Materials and New Processing Technology, Ministry of Education, School of Materials Science and Engineering, Guilin University of Technology, Guilin, 541004, China
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  • Yiliang Wang,

    1. State Key Laboratory Breeding Base of Nonferrous Metals and Specific Materials Processing, Key Laboratory of Nonferrous Materials and New Processing Technology, Ministry of Education, School of Materials Science and Engineering, Guilin University of Technology, Guilin, 541004, China
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  • Jie Chen,

    1. State Key Laboratory Breeding Base of Nonferrous Metals and Specific Materials Processing, Key Laboratory of Nonferrous Materials and New Processing Technology, Ministry of Education, School of Materials Science and Engineering, Guilin University of Technology, Guilin, 541004, China
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  • Huanfu Zhou,

    Corresponding author
    1. State Key Laboratory Breeding Base of Nonferrous Metals and Specific Materials Processing, Key Laboratory of Nonferrous Materials and New Processing Technology, Ministry of Education, School of Materials Science and Engineering, Guilin University of Technology, Guilin, 541004, China
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  • Liang Fang,

    1. State Key Laboratory Breeding Base of Nonferrous Metals and Specific Materials Processing, Key Laboratory of Nonferrous Materials and New Processing Technology, Ministry of Education, School of Materials Science and Engineering, Guilin University of Technology, Guilin, 541004, China
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  • Laijun Liu

    1. State Key Laboratory Breeding Base of Nonferrous Metals and Specific Materials Processing, Key Laboratory of Nonferrous Materials and New Processing Technology, Ministry of Education, School of Materials Science and Engineering, Guilin University of Technology, Guilin, 541004, China
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Abstract

(1−x)(K0.5Na0.5)NbO3xBa2NaNb5O15 [(1−x)KNNxBNN, 0 ≤ x ≤0.1] ceramics were prepared by solid-state reaction method. X-ray diffraction analysis of the ceramics revealed that the crystal structure changed from orthorhombic to rhombohedral with increasing BNN content. Dielectric measurement showed that the ceramics exhibited good dielectric temperature stability over a wide temperature range. Basic mechanisms of the conduction and relaxation processes have been investigated using impedance spectroscopy analyses. It was concluded that the conduction and relaxation processes were thermally activated and oxygen vacancies were the possible ionic charge carriers at higher temperatures.

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