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Direct Evidence for the Modulation Caused by Ti Substitution of Ta in a (Ta2O5)0.92(TiO2)0.08 Ceramic by Analytical Electron Microscopy

Authors

  • Xiaodong Wang,

    Corresponding author
    1. School of Materials Science and Engineering, Shanghai Jiao Tong University, Shanghai, China
    2. Department of Material Science and Engineering, Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois
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  • Jian-Min Zuo,

    1. Department of Material Science and Engineering, Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois
    2. Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois
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  • Hefei Hu,

    1. Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois
    2. Department of Physics, University of Illinois at Urbana-Champaign, Urbana, Illinois
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  • Yonghua Rong

    1. School of Materials Science and Engineering, Shanghai Jiao Tong University, Shanghai, China
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Abstract

The high-temperature tetragonal structure of Ta2O5 was observed in a Ta2O5 ceramic sample doped with 8 at.% TiO2. Direct evidences for the modulation along [math formula] direction caused by Ti replacing Ta are obtained based on atomic-resolution high-angle annular dark-field lattice imaging and electron energy loss spectroscopy analysis. The atomic mechanism of Ti substitution of Ta is explicitly described based on the structure model along [110] direction projection.

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