Journal of Applied Crystallography

© International Union of Crystallography

Cover image for Journal of Applied Crystallography

October 1977

Volume 10, Issue 5

Pages 369–430

  1. research papers

    1. Top of page
    2. research papers
    3. crystallographers
    1. Multiple diffraction in spinel and the space-group ambiguity (pages 369–371)

      P. Thompson and N. W. Grimes

      DOI: 10.1107/S0021889877013788

    2. Contribution de la diffraction neutronique à l'étude de la fonction texture du titane recristallisé, comparaison avec le diffraction des rayons X (pages 372–375)

      J. P. Mardon, M. Pernot, P. Dervin, R. Penelle and M. Englander

      DOI: 10.1107/S002188987701379X

    3. A general method for locating the X-ray source point in Kossel diffraction (pages 376–385)

      S. Biggin and D. J. Dingley

      DOI: 10.1107/S0021889877013806

    4. A computer-controlled X-ray powder diffraction system with an automatic sample changer (pages 386–389)

      H. J. Holland and R. C. Medrud

      DOI: 10.1107/S0021889877013818

    5. X-ray diffraction profiles fron neutron-irradiated LiF single crystals (pages 390–396)

      C. A. Pimentel and S. Caticha-Ellis

      DOI: 10.1107/S002188987701382X

    6. The limit of detection of amosite in two forms of calcium silicate matrix (pages 397–400)

      J. W. Critchell and P. E. J. Flewitt

      DOI: 10.1107/S0021889877013831

    7. X-ray line-broadening studies on austenitic stainless steel filings (pages 401–404)

      P. K. Nair and R. Vasudevan

      DOI: 10.1107/S0021889877013843

    8. Profile analysis of X-ray powder diffractometer data: structural refinement of La0.75Sr0.25CrO3 (pages 405–411)

      C. P. Khattak and D. E. Cox

      DOI: 10.1107/S0021889877013855

    9. Low-angle X-ray scattering with C Kα radiation (pages 412–414)

      O. Aita, H. Fujimoto, C. Sugiura and Y. Siota

      DOI: 10.1107/S0021889877013867

    10. A new method for the evaluation of small-angle scattering data (pages 415–421)

      O. Glatter

      DOI: 10.1107/S0021889877013879

    11. The use of integrals of the Airy diffraction intensity profile in X-ray topography of `spike' diffuse reflexions (pages 422–425)

      M. Moore and A. R. Lang

      DOI: 10.1107/S0021889877013880

    12. A pattern-recognition procedure for scanning oscillation films (pages 426–429)

      W. Kabsch

      DOI: 10.1107/S0021889877013892

  2. crystallographers

    1. Top of page
    2. research papers
    3. crystallographers
    1. Crystallographers (page 430)

      DOI: 10.1107/S0021889877013909

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