Journal of Applied Crystallography

Cover image for Journal of Applied Crystallography

August 1994

Volume 27, Issue 4

Pages 443–672

  1. research papers

    1. Top of page
    2. research papers
    3. short communications
    4. computer programs
    5. laboratory notes
    6. fast communications
    1. X-ray triple-crystal diffractometry of defects in epitaxic layers (pages 551–557)

      V. Holý, K. Wolf, M. Kastner, H. Stanzl and W. Gebhardt

      DOI: 10.1107/S0021889894000208

    2. The structure and optical activity of SrS2O6.4H2O (pages 563–566)

      E. De Matos Gomes, F. J. Zúñiga, J. Ortega and J. Etxebarria

      DOI: 10.1107/S0021889894000427

    3. SnB: crystal structure determination via shake-and-bake (pages 613–621)

      R. Miller, S. M. Gallo, H. G. Khalak and C. M. Weeks

      DOI: 10.1107/S0021889894000191

  2. short communications

    1. Top of page
    2. research papers
    3. short communications
    4. computer programs
    5. laboratory notes
    6. fast communications
  3. computer programs

    1. Top of page
    2. research papers
    3. short communications
    4. computer programs
    5. laboratory notes
    6. fast communications
    1. STATCW and STATCN: Fortran programs for conducting statistical tests for centrosymmetry (pages 653–659)

      S. Parthasarathy, K. Sekar, M. N. Ponnuswamy, N. Elango and S. Karthikeyan

      DOI: 10.1107/S0021889894001500

    2. Logistics of a program system. The DIRDIF program control and command protocol (pages 661–665)

      J. M. M. Smits, C. Smykalla, P. T. Buerskens, W. P. Bosman and S. García-Granda

      DOI: 10.1107/S0021889894000658

  4. laboratory notes

    1. Top of page
    2. research papers
    3. short communications
    4. computer programs
    5. laboratory notes
    6. fast communications
  5. fast communications

    1. Top of page
    2. research papers
    3. short communications
    4. computer programs
    5. laboratory notes
    6. fast communications

SEARCH

SEARCH BY CITATION