Journal of Applied Crystallography

Cover image for Journal of Applied Crystallography

June 1999

Volume 32, Issue 3

Pages 381–578

  1. research papers

    1. Top of page
    2. research papers
    3. short communications
    4. computer programs
    5. laboratory notes
    1. X-ray diffraction texture analysis of cylindrical samples (pages 387–392)

      R. Guillén, C. Cossu, T. Jacquot, M. François and B. Bourniquel

      DOI: 10.1107/S0021889898012990

    2. Texture and residual-stress analysis using a kappa goniometer (pages 393–396)

      R. Guillén, M. François, B. Bourniquel and E. Girard

      DOI: 10.1107/S0021889898015064

    3. K2(NbO)2Si4O12: a new ferroelectric (pages 421–425)

      M. C. Foster, D. J. Arbogast, P. Photinos, R. M. Nielson and S. C. Abrahams

      DOI: 10.1107/S0021889898016501

    4. Ab initio structure determination of sulfathiazole polymorph V from synchrotron X-ray powder diffraction data (pages 436–441)

      Fung Choy Chan, Jamshed Anwar, Robert Cernik, Paul Barnes and Rory McHardy Wilson

      DOI: 10.1107/S0021889898017233

    5. Isomorphism and mixed crystals in 2-R-naphthalenes: evidence of structural subfamilies and prediction of metastable forms (pages 481–488)

      Y. Haget, N. B. Chanh, A. Meresse, L. Bonpunt, F. Michaud, P. Negrier, M. A. Cuevas-Diarte and H. A. J. Oonk

      DOI: 10.1107/S0021889899002423

    6. Diffractometric crystal centering (pages 510–515)

      Przemyslaw Dera and Andrzej Katrusiak

      DOI: 10.1107/S0021889899002721

  2. short communications

    1. Top of page
    2. research papers
    3. short communications
    4. computer programs
    5. laboratory notes
  3. computer programs

    1. Top of page
    2. research papers
    3. short communications
    4. computer programs
    5. laboratory notes
  4. laboratory notes

    1. Top of page
    2. research papers
    3. short communications
    4. computer programs
    5. laboratory notes

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