Journal of Applied Crystallography

Cover image for Vol. 42 Issue 6

December 2009

Volume 42, Issue 6

Pages 981–1208

  1. research papers

    1. Top of page
    2. research papers
    3. computer programs
    4. laboratory notes
    1. Dependence of small-angle neutron scattering contrast on the difference in thermal expansions of phases in two-phase alloys (pages 981–989)

      Pavel Strunz, Ralph Gilles, Debashis Mukherji, Michael Hofmann, Dominique Del Genovese, Joachim Roesler, Markus Hoelzel and Vadim Davydov

      DOI: 10.1107/S0021889809035353

    2. Management of metadata and automation for mail-in measurements with the APS 11-BM high-throughput, high-resolution synchrotron powder diffractometer (pages 990–993)

      Brian H. Toby, Yu Huang, Don Dohan, David Carroll, Xuesong Jiao, Lynn Ribaud, Jennifer A. Doebbler, Matthew R. Suchomel, Jun Wang, Curt Preissner, David Kline and Tim M. Mooney

      DOI: 10.1107/S0021889809035717

    3. Study of structural defects in ZnGeP2 crystals by X-ray topography based on the Borrmann effect (pages 994–998)

      A. O. Okunev, G. A. Verozubova, E. M. Trukhanov, I. V. Dzjuba, P. R. J. Galtier and S. A. Said Hassani

      DOI: 10.1107/S0021889809037777

    4. Design challenges and performance of nested neutron mirrors for microfocusing on SNAP (pages 1004–1008)

      Gene E. Ice, Judy W. L. Pang, Chris Tulk, Jamie Molaison, Jae-Young Choi, Cody Vaughn, Lauren Lytle, Peter Z. Takacs, Ken H. Andersen, Terry Bigault and Ali Khounsary

      DOI: 10.1107/S0021889809037595

    5. Small-angle neutron scattering analysis of a water-based magnetic fluid with charge stabilization: contrast variation and scattering of polarized neutrons (pages 1009–1019)

      Mikhail V. Avdeev, Emmanuelle Dubois, Guillaume Mériguet, Elie Wandersman, Vasil M. Garamus, Artem V. Feoktystov and Regine Perzynski

      DOI: 10.1107/S0021889809036826

    6. Basal plane bending of 6H-SiC single crystals observed by synchrotron radiation X-ray topography (pages 1068–1072)

      Lina Ning, Xiaobo Hu, Yingmin Wang, Xiangang Xu, Yuqiang Gao, Yan Peng, Xiufang Chen, Wanxia Huang and Qingxi Yuan

      DOI: 10.1107/S002188980904196X

    7. Grating-based holographic X-ray diffraction: theory and application to confined fluids (pages 1129–1138)

      K. Nygård, D. K. Satapathy, O. Bunk, E. Perret, J. Buitenhuis, C. David and J. F. Van Der Veen

      DOI: 10.1107/S0021889809040990

    8. Energy-dispersive Laue diffraction by means of a frame-store pnCCD (pages 1139–1146)

      Sebastian Send, Marc Von Kozierowski, Tobias Panzner, Semen Gorfman, Kivanc Nurdan, Albert H. Walenta, Ullrich Pietsch, Wolfram Leitenberger, Robert Hartmann and Lothar Strüder

      DOI: 10.1107/S0021889809039867

    9. Depth-dependent local structures in thin films unraveled by grazing-incidence X-ray absorption spectroscopy (pages 1158–1164)

      Narcizo M. Souza-Neto, Aline Y. Ramos, Hélio C. N. Tolentino, Alessandro Martins and Antonio D. Santos

      DOI: 10.1107/S0021889809042678

    10. Development of a shutterless continuous rotation method using an X-ray CMOS detector for protein crystallography (pages 1165–1175)

      Kazuya Hasegawa, Kunio Hirata, Tetsuya Shimizu, Nobutaka Shimizu, Takaaki Hikima, Seiki Baba, Takashi Kumasaka and Masaki Yamamoto

      DOI: 10.1107/S0021889809042277

  2. computer programs

    1. Top of page
    2. research papers
    3. computer programs
    4. laboratory notes
    1. EXPO2009: structure solution by powder data in direct and reciprocal space (pages 1197–1202)

      Angela Altomare, Mercedes Camalli, Corrado Cuocci, Carmelo Giacovazzo, Anna Moliterni and Rosanna Rizzi

      DOI: 10.1107/S0021889809042915

  3. laboratory notes

    1. Top of page
    2. research papers
    3. computer programs
    4. laboratory notes