Journal of Applied Crystallography

Cover image for Vol. 45 Issue 1

February 2012

Volume 45, Issue 1

Pages 1–149

  1. research papers

    1. Top of page
    2. research papers
    3. short communications
    4. computer programs
    5. laboratory notes
    6. addenda and errata
    7. international union of crystallography
    8. book reviews
    1. Identification of unexpected hydrides in Mg–20 wt% Dy alloy by high-brilliance synchrotron radiation (pages 17–21)

      Weimin Gan, Yuanding Huang, Lei Yang, Karl Ulrich Kainer, Miao Jiang, Heinz-Günter Brokmeier and Norbert Hort

      DOI: 10.1107/S0021889811053088

    2. Quantification of passivation layer growth in inert anodes for molten salt electrochemistry by in situ energy-dispersive diffraction (pages 28–37)

      Matthew R. Rowles, Mark J. Styles, Ian C. Madsen, Nicola V. Y. Scarlett, Katherine McGregor, Daniel P. Riley, Graeme A. Snook, Andrew J. Urban, Thomas Connolley and Christina Reinhard

      DOI: 10.1107/S0021889811044104

    3. Synchrotron X-ray diffraction experiments with a prototype hybrid pixel detector (pages 38–47)

      C. Le Bourlot, P. Landois, S. Djaziri, P.-O. Renault, E. Le Bourhis, P. Goudeau, M. Pinault, M. Mayne-L'Hermite, B. Bacroix, D. Faurie, O. Castelnau, P. Launois and S. Rouzière

      DOI: 10.1107/S0021889811049107

    4. Investigation of indirect structural and chemical parameters of GeSi nanoparticles in a silica matrix by combined synchrotron radiation techniques (pages 71–84)

      Antonio Gasperini, Angelo Malachias, Gilberto Fabbris, Guinther Kellermann, Angelo Gobbi, Esteban Avendaño and Gustavo de Medeiros Azevedo

      DOI: 10.1107/S0021889811049302

    5. A two-dimensional waveguide beam for X-ray nanodiffraction (pages 85–92)

      Christina Krywka, Henrike Neubauer, Marius Priebe, Tim Salditt, Jozef Keckes, Adeline Buffet, Stephan Volkher Roth, Ralph Doehrmann and Martin Mueller

      DOI: 10.1107/S0021889811049132

    6. In situ lattice strain mapping during tensile loading using the neutron transmission and diffraction methods (pages 113–118)

      Kenji Iwase, Hirotaka Sato, Stefanus Harjo, Takashi Kamiyama, Takayoshi Ito, Shinichi Takata, Kazuya Aizawa and Yoshiaki Kiyanagi

      DOI: 10.1107/S0021889812000076

  2. short communications

    1. Top of page
    2. research papers
    3. short communications
    4. computer programs
    5. laboratory notes
    6. addenda and errata
    7. international union of crystallography
    8. book reviews
    1. Contrast matching of an Si substrate with polymer films by anomalous dispersion at the Si K absorption edge (pages 119–121)

      Hiroshi Okuda, Kohki Takeshita, Shojiro Ochiai, Yoshinori Kitajima, Shinichi Sakurai and Hiroki Ogawa

      DOI: 10.1107/S002188981105206X

  3. computer programs

    1. Top of page
    2. research papers
    3. short communications
    4. computer programs
    5. laboratory notes
    6. addenda and errata
    7. international union of crystallography
    8. book reviews
  4. laboratory notes

    1. Top of page
    2. research papers
    3. short communications
    4. computer programs
    5. laboratory notes
    6. addenda and errata
    7. international union of crystallography
    8. book reviews
  5. addenda and errata

    1. Top of page
    2. research papers
    3. short communications
    4. computer programs
    5. laboratory notes
    6. addenda and errata
    7. international union of crystallography
    8. book reviews
    1. You have free access to this content
  6. international union of crystallography

    1. Top of page
    2. research papers
    3. short communications
    4. computer programs
    5. laboratory notes
    6. addenda and errata
    7. international union of crystallography
    8. book reviews
  7. book reviews

    1. Top of page
    2. research papers
    3. short communications
    4. computer programs
    5. laboratory notes
    6. addenda and errata
    7. international union of crystallography
    8. book reviews

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