Journal of Educational Measurement

Cover image for Vol. 45 Issue 1

March 2008

Volume 45, Issue 1

Pages 1–97

  1. ORIGINAL ARTICLES

    1. Top of page
    2. ORIGINAL ARTICLES
    3. BOOK REVIEWS
    1. A Further Look at the Correlation Between Item Parameters and Item Fit Statistics (pages 1–15)

      Sandip Sinharay and Ying Lu

      Article first published online: 10 MAR 2008 | DOI: 10.1111/j.1745-3984.2007.00049.x

    2. An Approach to Evaluating the Missing Data Assumptions of the Chain and Post-stratification Equating Methods for the NEAT Design (pages 17–43)

      Paul W. Holland, Sandip Sinharay, Alina A. Von Davier and Ning Han

      Article first published online: 10 MAR 2008 | DOI: 10.1111/j.1745-3984.2007.00050.x

    3. Modeling Judgments in the Angoff and Contrasting-Groups Method of Standard Setting (pages 45–63)

      Daniël Van Nijlen and Rianne Janssen

      Article first published online: 10 MAR 2008 | DOI: 10.1111/j.1745-3984.2007.00051.x

  2. BOOK REVIEWS

    1. Top of page
    2. ORIGINAL ARTICLES
    3. BOOK REVIEWS

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