Evolute-based Hough transform method for characterization of ellipsoids
Version of Record online: 10 JAN 2013
© 2013 The Authors Journal of Microscopy © 2013 Royal Microscopical Society
Journal of Microscopy
Volume 249, Issue 3, pages 159–164, March 2013
How to Cite
KAYTANLI, B. and VALENTINE, M.T. (2013), Evolute-based Hough transform method for characterization of ellipsoids. Journal of Microscopy, 249: 159–164. doi: 10.1111/jmi.12004
- Issue online: 11 FEB 2013
- Version of Record online: 10 JAN 2013
- Received 4 September 2012; accepted 22 November 2012
Table S1. Parameters of the actual and detected ellipses on the synthetic images shown in Figure 2.
Table S2. HT-detected and least squares (LSQ) fit parameters for the single ellipsoidal particle shown in the electron micrograph in Figure 3.
Table S3. HT detected and least squares (LSQ) fit parameters for the polydisperse, imperfect ellipsoids shown in the electron micrograph in Figure 4.
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