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Journal of Microscopy

Cover image for Journal of Microscopy

April 2000

Volume 198, Issue 1

Pages 1–75

  1. Original Articles

    1. Top of page
    2. Original Articles
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      Images of absolute retardance Ln, using the rotating polariser method (pages 1–9)

      Geday, Kaminsky, Lewis and Glazer

      Version of Record online: 24 DEC 2001 | DOI: 10.1046/j.1365-2818.2000.00687.x

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      Bituminous emulsions and their characterization by atomic force microscopy (pages 10–16)

      Loeber, Alexandre, Muller, Triquigneaux, Jolivet and Malot

      Version of Record online: 24 DEC 2001 | DOI: 10.1046/j.1365-2818.2000.00667.x

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      Tracking differential interference contrast diffraction line images with nanometre sensitivity (pages 34–53)

      G. Danuser, P. T. Tran and E. D. Salmon

      Version of Record online: 16 JAN 2004 | DOI: 10.1111/j.1365-2818.2000.00678.x

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