Annals of the New York Academy of Sciences

Cover image for Annals of the New York Academy of Sciences

July 1951

Volume 53 Specific Methods of Analysis

Pages 997–1118

    1. X-RAY ABSORPTION IN CHEMICAL ANALYSIS AND CONTROL (pages 997–1014)

      Herman A. Liebhafsky

      Version of Record online: 15 DEC 2006 | DOI: 10.1111/j.1749-6632.1951.tb48878.x

    2. THE ANALYTICAL SPECIFICITY OF COUNTERCURRENT DISTRIBUTION (pages 1015–1030)

      J. Delafield Gregory and Lyman C. Craig

      Version of Record online: 15 DEC 2006 | DOI: 10.1111/j.1749-6632.1951.tb48879.x

    3. OPTICAL PROPERTIES OF SURFACE FILMS (pages 1054–1063)

      Alexandre Rothen

      Version of Record online: 15 DEC 2006 | DOI: 10.1111/j.1749-6632.1951.tb48881.x

    4. MEASUREMENT OF PROPERTIES OF THIN FILMS ON CHROMIUM BY THE REFLECTION OF POLARIZED LIGHT (pages 1064–1081)

      J. B. Bateman and Margaret W. Harris

      Version of Record online: 15 DEC 2006 | DOI: 10.1111/j.1749-6632.1951.tb48882.x

    5. GONIOMETRIC ANALYSIS OF CRYSTALS (pages 1082–1086)

      J. D. H. Donnay

      Version of Record online: 15 DEC 2006 | DOI: 10.1111/j.1749-6632.1951.tb48883.x

    6. ANALYSIS OF MIXTURES BASED ON RATES OF REACTION (pages 1093–1107)

      T. S. Lee and I. M. Kolthoff

      Version of Record online: 15 DEC 2006 | DOI: 10.1111/j.1749-6632.1951.tb48885.x

    7. AUTOMATIC PAPER CHROMATOGRAPHY (pages 1108–1118)

      Ralph H. Müller and Doris L. Clegg

      Version of Record online: 15 DEC 2006 | DOI: 10.1111/j.1749-6632.1951.tb48886.x

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