Annals of the New York Academy of Sciences

Cover image for Annals of the New York Academy of Sciences

March 1978

Volume 306 Short Wavelength Microscopy

Pages 1–339

    1. OPENING REMARKS (pages 1–2)

      Donald F. Parsons

      Version of Record online: 16 DEC 2006 | DOI: 10.1111/j.1749-6632.1978.tb25634.x

  1. Part I. Radiation Damage by Electrons in Present-Day Electon Microscopy

    1. Top of page
    2. Part I. Radiation Damage by Electrons in Present-Day Electon Microscopy
    3. Part II. Other Deleterious Electron Inelastic Scattering Effects
    4. Part III. Ways to Reduce Electron Damage during Microscopy
    5. Part IV. Short Wavelength Microscopy Using Nonelectron Beams: Charged Particles
    6. Part V. Short Wavelength Microscopy Using Nonelectron Beams: Noncharged Particles
    7. Part VI. Future Possibilities: Other Charged Particles
  2. Part II. Other Deleterious Electron Inelastic Scattering Effects

    1. Top of page
    2. Part I. Radiation Damage by Electrons in Present-Day Electon Microscopy
    3. Part II. Other Deleterious Electron Inelastic Scattering Effects
    4. Part III. Ways to Reduce Electron Damage during Microscopy
    5. Part IV. Short Wavelength Microscopy Using Nonelectron Beams: Charged Particles
    6. Part V. Short Wavelength Microscopy Using Nonelectron Beams: Noncharged Particles
    7. Part VI. Future Possibilities: Other Charged Particles
    1. UTILIZATION OF INELASTIC SCATTER IN THE STEM MODE (pages 62–72)

      E. Zeitler

      Version of Record online: 16 DEC 2006 | DOI: 10.1111/j.1749-6632.1978.tb25639.x

    2. A HIGH-RESOLUTION AUGER ELECTRON MICROSCOPE USING FOIL LENSES (pages 75–84)

      J. G. King, J. W. Coleman and E. H. Jacobsen

      Version of Record online: 16 DEC 2006 | DOI: 10.1111/j.1749-6632.1978.tb25640.x

  3. Part III. Ways to Reduce Electron Damage during Microscopy

    1. Top of page
    2. Part I. Radiation Damage by Electrons in Present-Day Electon Microscopy
    3. Part II. Other Deleterious Electron Inelastic Scattering Effects
    4. Part III. Ways to Reduce Electron Damage during Microscopy
    5. Part IV. Short Wavelength Microscopy Using Nonelectron Beams: Charged Particles
    6. Part V. Short Wavelength Microscopy Using Nonelectron Beams: Noncharged Particles
    7. Part VI. Future Possibilities: Other Charged Particles
    1. PULSED ELECTRON BEAMS TO REDUCE RADIATION DAMAGE? (pages 85–94)

      R. A. Bonham and R. E. Kennerly

      Version of Record online: 16 DEC 2006 | DOI: 10.1111/j.1749-6632.1978.tb25641.x

    2. IMAGE ANALYSIS AND BEAM DAMAGE (pages 95–111)

      R. E. Burge, R. F. Scott and J. Thorn

      Version of Record online: 16 DEC 2006 | DOI: 10.1111/j.1749-6632.1978.tb25642.x

    3. TRACE STRUCTURE ANALYSIS (pages 121–144)

      W. Hoppe

      Version of Record online: 16 DEC 2006 | DOI: 10.1111/j.1749-6632.1978.tb25644.x

    4. COMMENTS ON NONDESTRUCTIVE MICROSCOPY (pages 156–157)

      L. Marton

      Version of Record online: 16 DEC 2006 | DOI: 10.1111/j.1749-6632.1978.tb25646.x

  4. Part IV. Short Wavelength Microscopy Using Nonelectron Beams: Charged Particles

    1. Top of page
    2. Part I. Radiation Damage by Electrons in Present-Day Electon Microscopy
    3. Part II. Other Deleterious Electron Inelastic Scattering Effects
    4. Part III. Ways to Reduce Electron Damage during Microscopy
    5. Part IV. Short Wavelength Microscopy Using Nonelectron Beams: Charged Particles
    6. Part V. Short Wavelength Microscopy Using Nonelectron Beams: Noncharged Particles
    7. Part VI. Future Possibilities: Other Charged Particles
    1. ION MICROSCOPY: HISTORY AND ACTUAL TRENDS (pages 158–182)

      Pierre Grivet and A. Septier

      Version of Record online: 16 DEC 2006 | DOI: 10.1111/j.1749-6632.1978.tb25647.x

    2. SOME EXPERIENCES WITH X-RAY AND PROTON MICROSCOPES (pages 203–222)

      Paul Horowitz

      Version of Record online: 16 DEC 2006 | DOI: 10.1111/j.1749-6632.1978.tb25650.x

    3. THE SCANNING ION MICROPROBE: AN ALTERNATIVE TO THE SCANNING ELECTRON MICROSCOPE (pages 223–261)

      Z. H. Cho, M. Singh and G. C. Huth

      Version of Record online: 16 DEC 2006 | DOI: 10.1111/j.1749-6632.1978.tb25651.x

  5. Part V. Short Wavelength Microscopy Using Nonelectron Beams: Noncharged Particles

    1. Top of page
    2. Part I. Radiation Damage by Electrons in Present-Day Electon Microscopy
    3. Part II. Other Deleterious Electron Inelastic Scattering Effects
    4. Part III. Ways to Reduce Electron Damage during Microscopy
    5. Part IV. Short Wavelength Microscopy Using Nonelectron Beams: Charged Particles
    6. Part V. Short Wavelength Microscopy Using Nonelectron Beams: Noncharged Particles
    7. Part VI. Future Possibilities: Other Charged Particles
    1. ASSESSMENT OF THE POTENTIAL OF ULTRASOFT X-RAY MICROSCOPY (pages 286–290)

      D. Sayre, J. Kirz, R. Feder, D. M. Kim and E. Spiller

      Version of Record online: 16 DEC 2006 | DOI: 10.1111/j.1749-6632.1978.tb25654.x

    2. COMPARATIVE ANALYSIS OF X-RAY EMISSION MICROSCOPIES FOR BIOLOGICAL SPECIMENS (pages 291–305)

      Janos Kirz, David Sayre and James Dilger

      Version of Record online: 16 DEC 2006 | DOI: 10.1111/j.1749-6632.1978.tb25655.x

  6. Part VI. Future Possibilities: Other Charged Particles

    1. Top of page
    2. Part I. Radiation Damage by Electrons in Present-Day Electon Microscopy
    3. Part II. Other Deleterious Electron Inelastic Scattering Effects
    4. Part III. Ways to Reduce Electron Damage during Microscopy
    5. Part IV. Short Wavelength Microscopy Using Nonelectron Beams: Charged Particles
    6. Part V. Short Wavelength Microscopy Using Nonelectron Beams: Noncharged Particles
    7. Part VI. Future Possibilities: Other Charged Particles
    1. THE FEASIBILITY OF HEAVY CHARGED-PARTICLE MICROSCOPY (pages 322–339)

      T. C. Yang, G. Welch, C. A. Tobias, H. Maccabee, T. Hayes, L. Craise, E. V. Benton and F. Abrams

      Version of Record online: 16 DEC 2006 | DOI: 10.1111/j.1749-6632.1978.tb25657.x

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