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Keywords:

  • Amorphous silicon;
  • flat-panel detectors;
  • scintillator;
  • indirect conversion

Abstract— Large-area amorphous-silicon flat-panel x-ray imaging detectors were introduced commercially about 10 years ago and have seen a steady increase in both volume and number of applications since. The flat-panel-detector industry was made possible by manufacturing methods and equipment first developed for the display industry. Here, the different types of flat-panel detectors are described, with focus on the scintillator-based TFT/photodiode detector. The manufacturing process used for these detectors is explained and compared to that for displays. Detector operation is detailed, and the various medical and industrial applications are described. Finally, the performance metrics for these detectors and the impact of the performance requirements on detector design are discussed.