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Greet Kerckhofs, Grzegorz Pyka, Maarten Moesen, Simon Van Bael, Jan Schrooten and Martine Wevers High-Resolution Microfocus X-Ray Computed Tomography for 3D Surface Roughness Measurements of Additive Manufactured Porous Materials Advanced Engineering Materials 15

Article first published online: 12 OCT 2012 | DOI: 10.1002/adem.201200156

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A novel protocol for surface roughness measurements of 3D additive manufactured (AM) porous structures based on high-resolution micro-CT images is described. The roughness parameters are determined based on the profile lines of the strut surfaces in the binarized 2D cross-sectional micro-CT images. Validation of this novel methodology shows that micro-CT can be applied accurately for micro-scale surface roughness quantification of 3D AM porous materials, but depending on the dimensions of the roughness, the micro-CT acquisition parameters need to be fine-tuned.

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