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Tilman Zscheckel, Wolfgang Wisniewski and Christian Rüssel Microstructure and Texture of Polycrystalline CVD-ZnS Analyzed via EBSD Advanced Functional Materials 22

Version of Record online: 25 JUL 2012 | DOI: 10.1002/adfm.201103131

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Industrially produced chemical vapor deposition (CVD)-ZnS is analyzed using electron backscatter diffraction (EBSD) and X-ray diffraction (XRD). Wurtzite is detected within the first layer of deposition. The following 1000 μm of crystal growth occur in the form of large, heavily twinned grains. A sharp grain-size transition to grains <50 μm in length is observed. Local textures are described as well as twinning and grain fragmentation in the form of continuous orientation change.

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