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Ming-Fai Lo, Tsz-Wai Ng, Hin-Wai Mo and Chun-Sing Lee Direct Threat of a UV-Ozone Treated Indium-Tin-Oxide Substrate to the Stabilities of Common Organic Semiconductors Advanced Functional Materials 23

Article first published online: 23 OCT 2012 | DOI: 10.1002/adfm.201202120

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UV-ozone treated indium tin oxide (ITO) is used extensively in organic electronics. It is shown that UV-ozone treatment can cause potential threats leading to degradation of organic materials. In accelerated degradation tests, rubrene formed on an ITO-free region always shows stronger photoluminescence (PL) emission than a region with an ITO coating. The degradation mechanism for UV-ozone treated ITO is discussed based on the photoemission analysis and device studies.

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