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Daisuke Kan, Ryotaro Aso, Hiroki Kurata and Yuichi Shimakawa Thickness-Dependent Structure–Property Relationships in Strained (110) SrRuO3 Thin Films Advanced Functional Materials 23

Version of Record online: 4 OCT 2012 | DOI: 10.1002/adfm.201202402

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Thickness-dependent structure–property relationships in strained SrRuO3 thin films are reported. The thin film changes from the monoclinic structure below 16 nm to the tetragonal structure above the thickness. The thickness-dependent structure is ascribed to the substrate-induced modification in the RuO6 octahedral rotation pattern. Physical properties such as magnetic anisotropy are closely related to the thin-film structure.

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