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Maria Kalyva, Jiri Orava, Angeliki Siokou, Martin Pavlista, Tomas Wagner and Spyros N. Yannopoulos Reversible Amorphous-to-Amorphous Transitions in Chalcogenide Films: Correlating Changes in Structure and Optical Properties Advanced Functional Materials 23

Article first published online: 19 NOV 2012 | DOI: 10.1002/adfm.201202461

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X-ray photoelectron spectroscopy and spectroscopic ellipsometry are combined to study reversible switching in the structure and optical properties of As50Se50 thin films prepared by pulsed-laser deposition. Switching is driven by near-bandgap light illumination and thermal annealing. The mechanism, namely, the amorphous-to-amorphous transition, is unique for pulsed-laser-deposited films. No such effect is observed for films of the same composition prepared by thermal evaporation.

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