An-Ping Li, Kendal W. Clark, X.-G. Zhang and Arthur P. Baddorf Electron Transport at the Nanometer-Scale Spatially Revealed by Four-Probe Scanning Tunneling Microscopy Advanced Functional Materials 23
Electrical transport measurement methods with a four-probe scanning tunneling microscope and recent progress on its applications in nanomaterials with a focus on probing structure-transport relationships at the nanometer-scale are described. A broad range of nanomaterials are covered, including surface supported quasi-1D and 2D electronic systems, semiconducting and metallic nanowires, carbon nanotubes, and graphene. The effects of atomic defects, grain boundaries, interfaces, and electronic interactions are discussed.
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