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Te Yu Chien, Jak Chakhalian, John W. Freeland and Nathan P. Guisinger Cross-Sectional Scanning Tunneling Microscopy Applied to Complex Oxide Interfaces Advanced Functional Materials 23

Version of Record online: 26 MAR 2013 | DOI: 10.1002/adfm.201203430

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Cross-sectional scanning tunneling microscopy and spectroscopy (XSTM/S) for complex oxides has recently been developed. XSTM/S is an ideal tool to directly probe the electronic properties at interfaces of dissimilar complex oxides. The understanding of the emerging phenomena at complex oxide interfaces could be pushed further with the nanometer-scale electronic information obtained by XSTM/S.

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