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Volker Rose, Kangkang Wang, TeYu Chien, Jon Hiller, Daniel Rosenmann, John W. Freeland, Curt Preissner and Saw-Wai Hla Synchrotron X-Ray Scanning Tunneling Microscopy: Fingerprinting Near to Far Field Transitions on Cu(111) Induced by Synchrotron Radiation Advanced Functional Materials 23

Version of Record online: 22 MAR 2013 | DOI: 10.1002/adfm.201203431

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Nanofabricated insulator-coated smart tips are indispensible for stable tunneling conditions in synchrotron X-ray enhanced scanning tunneling microscopy. An unambiguous and direct way of fingerprinting tunneling to far field transitions of the tip that relies on the simultaneous analysis of the X-ray-induced tip and sample current is presented.

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