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E. William Cowell III, Nasir Alimardani, Christopher C. Knutson, John F. Conley Jr., Douglas A. Keszler, Brady J. Gibbons and John F. Wager Advancing MIM Electronics: Amorphous Metal Electrodes Advanced Materials 23

Version of Record online: 25 OCT 2010 | DOI: 10.1002/adma.201002678

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Amorphous metal thin films with atomically smooth surfaces are employed as contact layers for the realization of metal-insulator-metal (MIM) devices operating on the basis of controlled quantum mechanical tunneling through an ultrathin dielectric.

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