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Ruipeng Li, Jeremy W. Ward, Detlef-M. Smilgies, Marcia M. Payne, John E. Anthony, Oana D. Jurchescu and Aram Amassian Direct Structural Mapping of Organic Field-Effect Transistors Reveals Bottlenecks to Carrier Transport Advanced Materials 24

Version of Record online: 10 AUG 2012 | DOI: 10.1002/adma.201201856

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X-ray microbeam scattering is used to map the microstructure of the organic semiconductor along the channel length of solution-processed bottom-contact OFET devices. Contact-induced nucleation is known to influence the crystallization behavior within the channel. We find that microstructural inhomogeneities in the center of the channel act as a bottleneck to charge transport. This problem can be overcome by controlling crystallization of the preferable texture, thus favoring more efficient charge transport throughout the channel.

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