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Gustaaf Van Tendeloo, Sara Bals, Sandra Van Aert, Jo Verbeeck and Dirk Van Dyck Advanced Electron Microscopy for Advanced Materials Advanced Materials 24

Article first published online: 21 AUG 2012 | DOI: 10.1002/adma.201202107

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Recent advances in electron microscopy enable a complete characterization of a broad range of materials. Such analyses (see figure from left to right) reveal the morphology of nanocrystals, valence state of individual atomic columns, geometry of ultrasmall clusters as well as picometer displacements at interfaces. Also 3D atomic resolution is nowadays possible.

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