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Dominik Wildanger, Brian R. Patton, Heiko Schill, Luca Marseglia, J. P. Hadden, Sebastian Knauer, Andreas Schönle, John G. Rarity, Jeremy L. O'Brien, Stefan W. Hell and Jason M. Smith Solid Immersion Facilitates Fluorescence Microscopy with Nanometer Resolution and Sub-Ångström Emitter Localization Advanced Materials 24

Article first published online: 12 SEP 2012 | DOI: 10.1002/adma.201203033

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Exploring the maximum spatial resolution achievable in far-field optical imaging, we show that applying solid immersion lenses (SIL) in stimulated emission depletion (STED) microscopy addresses single spins with a resolution down to 2.4 ± 0.3 nm and with a localization precision of 0.09 nm.

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