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Martin Kalbac, Ossi Lehtinen, Arkady V. Krasheninnikov and Juhani Keinonen Ion-Irradiation-Induced Defects in Isotopically-Labeled Two Layered Graphene: Enhanced In-Situ Annealing of the Damage Advanced Materials 25

Version of Record online: 26 NOV 2012 | DOI: 10.1002/adma.201203807

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Contrary to theoretical estimates based on the conventional binary collision model, experimental results indicate that the number of defects in the lower layer of the bi-layer graphene sample is smaller than in the upper layer. This observation is explained by in situ self-annealing of the defects.

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